2 works Add another?
Most Editions
Most Editions
First Published
Most Recent
Top Rated
Reading Log
Trending
Random
Subjects
Defects, Integrated circuits, Materials, Metal oxide semiconductor field-effect transistors, Microelectronics, Testing, Circuits intégrés, Digital, Défauts, Electronics, Integrerade kretsar, Mikroelektronik, TECHNOLOGY & ENGINEERINGID Numbers
- OLID: OL3756231A
Links outside Open Library
No links yet. Add one?
| April 30, 2008 | Created by an anonymous user | initial import |